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![[Translate to chinese:] Camera image during auto alignment. The feedback lines indicate if the correct edges in the image are detected. Green: Vertical center line; Magenta: Upper edge of the light gap; White: Lower edge of the light gap (not visible here, falling together with red line); Red: Knife edge; Blue: Left and right edge of the block face being automatically detected.](/fileadmin/_processed_/d/1/csm_Camera_image_during_auto_alignment_UC_Enuity_c148ecb865.jpg "[Translate to chinese:] Camera image during auto alignment. The feedback lines indicate if the correct edges in the image are detected. Green: Vertical center line")
高质量超薄切片：样品与切片刀自动对齐
超薄切片技术是获取样品切片的最常用方法。在室温条件制备时，将样品小块嵌入环氧树脂中，然后通过修剪去除多余的树脂，并使用玻璃刀或金刚石刀将样品切成厚度为50-100纳米之间的薄片。
![[Translate to chinese:] Section ribbons with increasing section thickness - silver to purple ending in blue sections.](/fileadmin/_processed_/7/2/csm_Section_ribbons_with_increasing_section_thickness_8b0ba46e79.jpg "[Translate to chinese:] Section ribbons with increasing section thickness - silver to purple ending in blue sections.")
![[Translate to chinese:] Water Flea Daphnia imaged by Electron Microscopy. Courtesy of Mag. Dr. Gruber, University of Vienna, Austria](/fileadmin/_processed_/e/d/csm_EM_Application_Water_Flea_Daphnia_7abc89f4fb.jpg "[Translate to chinese:] Water Flea Daphnia imaged by Electron Microscopy. Courtesy of Mag. Dr. Gruber, University of Vienna, Austria.")
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![[Translate to chinese:] Acrylonitrile butadiene styrene (ABS) stained with osmium tetroxide (OsO4), sectioned with a DIATOME diamond knife at room temperature, and then imaged with HAADF TEM.](/fileadmin/_processed_/a/b/csm_ABS_stained_with_OsO4_and_sectioned_with_a_DIATOME_diamond_knife_66be7f4863.jpg "[Translate to chinese:] Acrylonitrile butadiene styrene (ABS) stained with osmium tetroxide (OsO4), sectioned with a DIATOME diamond knife at room temperature, and then imaged with HAADF TEM.")
用于材料切片的超薄切片技术
了解这些用于材料切片的超薄切片技术的宝贵见解，并学习如何克服在处理聚合物、金属和脆性材料时遇到的挑战。千万不要错过这个提高您对先进显微镜样品制备方法的认识的机会。
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超薄切片介绍
对样本开展研究时，为了以纳米级分辨率显示其精细结构，通常会使用到电子显微镜。电子显微镜有两种类型：扫描电子显微镜（SEM）用于对样本表面成像，以及需要使用极薄电子透明样本的透射电子显微镜（TEM）。因此，使用电子显微镜对样本内部的精细结构进行成像时，此类技术解决方案需要制作出非常薄的样本切片。被称为超显微技术的样本制备方法可以产生具有最小伪影的超薄切片（厚度20-150nm）。在切片过程中，样本的…
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Array Tomography for SEM 3D Reconstruction
Array tomography (AT) is a 3D image reconstruction technique for high resolution, quantitative analysis of biological structures. For optimal results, ultrathin and ordered sections are an absolute…
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样本修块简介
使用超薄切片机制作样本超薄切片前需要预制样本。在预制过程中，必须特别留意样本尺寸（切片尺寸）、样本位置（目标定位）和块面边缘精准度。这个过程通常叫做修块，在此过程中样本大多被修块成金字塔截头锥体的形状。