工业

工业

工业

深入探讨有关工业和病理学领域的高效检测、优化工作流程和提高人体工学舒适度的文章和网络研讨会。涉及的主题包括质量控制、材料分析、病理学显微镜等。在这里您可以获得有关使用前沿技术提高生产力和优化质量以及准确地进行病理学诊断的干货。
Particle analysis with the Visoria M microscope

AI-Based Particle Counting with the Aivaro AI Feature Detection Software Module

The Aivaro AI Feature Detection software module enables fast manual microscope inspection of particulate contamination on various material samples. By training different classes, reflective particles,…
Overview of Artificial Intelligence (AI) and Machine Learning

An Overview of Artificial Intelligence (AI) and Machine Learning

AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…
AI-based inspection detects, classifies, and measures defects directly in microscope images of components.

AI Image Analysis for Reliable Defect Detection

AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…
Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…
带有大量夹杂物的原生刚玉玻璃图像。这是使用偏振对比显微镜拍摄的。

利用偏光显微镜优势确保玻璃质量

玻璃是已知最古老的材料之一。如今,玻璃被广泛应用于各种领域,如光学仪器、门窗、太阳能电池板、食品、饮料和药品容器等,因此必须符合严格的玻璃质量标准,尤其是光学玻璃。利用偏光显微镜对平板玻璃、中空玻璃和压制玻璃进行质量控制既快捷又经济。无需进行耗时的样品制备,即可对结节、金属、晶体夹杂物和气泡等缺陷进行分析。
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6 英寸晶片检测显微镜,可靠的观察微小高度差

本文介绍了一种 6 英寸晶圆检测显微镜,无论用户的技术水平如何,它都能自动进行可重复的 DIC(微分干涉对比)成像。集成电路 (IC) 芯片和半导体元件的制造需要晶圆检测,以确保不存在影响性能的缺陷。通常使用光学显微镜进行质量控制、故障分析和 R&D 检测。为了有效地观察晶圆上结构之间的微小高度差,可以使用 DIC。
Quality assurance during production in a manufacturing plant.

跨行业的质量保证改进

精确是最重要的。试想一下,心脏起搏器在运行过程中发生故障,或者半导体缺陷导致关键系统崩溃。在医疗设备、电子产品和半导体等行业,误差几乎为零。质量保证(QA)不再仅仅是一项监管要求,而是一项推动业务成功和保护品牌完整性的战略优势。
Leitz Laborlux: Tartaric acids, polarization contrast

偏振光显微观察

偏光显微镜通常应用于材料科学和地质学领域,根据矿物的折射特性和颜色来识别矿物。在生物学中,偏光显微镜通常用于晶体等双折射结构的识别或成像,或用于植物细胞壁中纤维素和淀粉粒的成像。

材料科学样本制备方法的工作流程解决方案

本手册介绍并解释了材料科学样本制备最常用的样本制备方法的工作流程解决方案:
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