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![[Translate to chinese:] Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).](/fileadmin/_processed_/a/1/csm_Organic_contamination_on_a_wafer_surface_04e3f993e7.jpg "[Translate to chinese:] Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface.")
晶圆上的光刻胶残留和有机污染物的可视化
随着半导体上集成电路（IC）的尺寸低于10纳米，在晶圆检测中有效检测光刻胶残留等有机污染物和缺陷变得越来越重要。光学显微镜仍然是常见的检测方法，但对于有机污染物，明场和其他类型的照明可能会存在局限性。…
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![[Translate to chinese:] Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.](/fileadmin/_processed_/7/6/csm_Burrs_at_the_edge_of_a_battery_electrode_860034a629.jpg "[Translate to chinese:] Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.")
电池制造过程中的毛刺检测
毛刺是电池电极片边缘可能出现的缺陷，例如在制造过程中的分切环节。它们可能会因诸如短路等故障导致电池性能下降，并引发安全和可靠性问题。毛刺检测是电池生产质量控制的重要部分，对于生产具有可靠性能和寿命的电…
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