Explore the Future of 3D Imaging: Join the Volume EM Course

With Expert Insights from Leica Microsystems

Recent breakthroughs in scanning electron microscopy (SEM) have opened new frontiers in 3D imaging of biological tissues. The upcoming multi-day Volume EM course offers a unique opportunity to dive deep into the latest SEM-based techniques—serial block-face SEM, focused ion beam SEM, and array tomography—that are revolutionizing volume electron microscopy (vEM).

Why Attend?

Participants will gain:

• A comprehensive understanding of the three core vEM techniques.
• Practical insights into optimizing imaging conditions, data processing, and analysis workflows.
• The ability to evaluate which technique best suits their research needs.

This course is designed to empower researchers and service providers with the tools and knowledge to stay ahead in the fast-evolving field of volume EM.

Leica Microsystems at the Forefront

We’re proud to announce that Pinto, Andreia, Advanced Workflow Specialist at Leica Microsystems, will be among the course speakers. Andreia brings deep expertise in electron microscopy workflows and will share practical insights into optimizing volume EM techniques for real-world applications.

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