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![[Translate to chinese:] Particulate contamination in between moving metal plates.](/fileadmin/_processed_/b/d/csm_Particulate_contamination_in_between_moving_metal_plates_2_ec4b8bf9ea.jpg "[Translate to chinese:] Particulate contamination in between moving metal plates.")
高效清洁度分析的关键因素
在汽车和电子行业，零部件上细小的污染颗粒物也可能影响产品的性能，导致产品出现故障，或使用寿命缩短。对于汽车来说，过滤系统很容易受到影响。对于电子产品来说，印刷电路板（PCB）或连接器上的污染可能会导致短路。因此，清洁度在现代制造业的质量控制中占有核心地位，特别是使用由不同供应商生产的部件时，更要重点关注清洁情况。车辆或设备的关键部件如果受到污染，整个系统就可能发生故障。因此，高效清洁度分析过程必须…
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![[Translate to chinese:] Microscope equipped with a K7 color CMOS camera for life-science and industry imaging applications.](/fileadmin/_processed_/9/e/csm_Microscope_equipped_with_a_K7_color_CMOS_d4485ce44f.jpg "[Translate to chinese:] Microscope equipped with a K7 color CMOS camera for life-science and industry imaging applications.")
数码显微镜摄像头和图像分析的基础技术术语定义
现今绝大多数显微镜都配置了摄像头。摄像头的特征通常决定了所采集到的图像是否能够揭示出研究人员希望观察到的现象。但深入到摄像头术语时，技术术语十分繁杂。我们汇总整理了最为重要的术语及其简明释意以便提供方向。这些术语按字母顺序排列。
![[Translate to chinese:] Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.](/fileadmin/_processed_/9/1/csm_Processed_wafer_standard_and_oblique_brightfield_illumination_fb296b5b5d.jpg "[Translate to chinese:] Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illuminati")
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![[Translate to chinese:] Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.](/fileadmin/_processed_/3/b/csm_Grinding_polishing_EM_TXP_91d5c1584d.jpg "[Translate to chinese:] Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.")
电子产品制造截面分析
本文将讨论印刷电路板 (PCB) 和总成 (PCBA)、集成电路 (IC) 和电池组件的横截面为什么对质量控制 (QC)、故障分析 (FA) 和研发 (R&D) 有效，以及如何制备这些横截面。
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Epi-Illumination Fluorescence and Reflection-Contrast Microscopy
This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
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![[Translate to chinese:] Material sample with a large height, size, and weight being observed with an inverted microscope.](/fileadmin/_processed_/f/4/csm_Inverted_microscope_with_large_sample_crop_04c3257c81.jpg "[Translate to chinese:] Material sample with a large height, size, and weight being observed with an inverted microscope.")
工业应用中倒置显微镜相较于正置显微镜的五大优势
使用倒置显微镜时，您需要从下方观察样本，因为倒置显微镜的光学元件位于样本下方，而使用正置显微镜时，您需要从上方观察样本。一直以来，倒置显微镜主要用于生命科学研究，因为重力将样本沉入含有水性溶液的托座底部，从上方则无法观察到太多内容。但近段时间以来，倒置显微镜在工业应用中也变得越来越流行。我们现在一起来了解倒置显微镜在工业应用中的优势。
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Coherent Raman Scattering Microscopy Publication List
CRS (Coherent Raman Scattering) microscopy is an umbrella term for label-free methods that image biological structures by exploiting the characteristic, intrinsic vibrational contrast of their…
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![[Translate to chinese:] Image of an onion flake taken with a basic Leica compound microscope after it was tested for resistance to fungus and mold growth following part 11 of the ISO 9022 standard.](/fileadmin/_processed_/2/f/csm_Image_of_an_onion_flake_acquired_after_ISO_9022-11_test_c031fc8f05.jpg "[Translate to chinese:] Image of an onion flake taken with a basic Leica compound microscope after it was tested for resistance to fungus and mold growth following part 11 of the ISO 9022 standard.")
ISO 9022 标准第 11 部分 - 在苛刻条件下测试显微镜
显微镜和其他光学仪器会受到环境因素的影响。环境因素取决于地理位置和使用地点的条件。仪器的坚固性可以通过完善的加速测试方法进行评估。ISO 9022 标准第 11 部分规定了测试光学仪器抗霉菌和真菌生长的方法。