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显微镜科学与教学知识中心

显微镜科学与教学知识中心

徕卡显微系统的知识库提供有关显微镜学科的科学研究和教学材料。内容旨在对显微镜初学者、有经验的显微镜操作实践者和使用显微镜的科学家在他们的日常工作和实验有所帮助。这里有探索交互式教程和应用笔记,你可以找到你需要的显微镜的基础知识以及前沿技术——快来加入徕卡显微知识社区,分享您的专业知识!

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Porous Ceramics - Sample Preparation for SEM

Application Note for Leica EM RES102 - Ceramic membrane filters with pore sizes down to a few nanometres must be investigated in cross-section with regard to the structure of the pores. The smallest…

Paper Samples - Sample Preparation for SEM

Application Note for Leica EM RES102 - A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard to its applicability. With the use of ion beam…

Ion Beam Polishing of Sample Surfaces - Sample Preparation for SEM

Application Note for Leica EM RES102 - Ion milling can be used to reduce the roughness of sample surfaces. Small angles less than 6° with respect to the sample surface are necessary. The high voltage…
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