Peter Bauer , Dipl. Geol.

Peter Bauer

Peter Bauer, Director Product Management ID, Heerbrugg Switzerland, graduated in Geology (with a primary focus on Structural Geology) from the Justus-Liebig University in Gießen/Germany. During his master thesis, he was working on Fluid and Methane Transport in Accretionary Wedges. From 1996 to 1999, he worked on experimental deformation of rock analogue material with in-situ observation to draw conclusions of the deformation behavior of  rock at the brittle-ductile transition. Throughout this entire time, he was working intensively with different kinds of microscopes and was a customer of Leica. In 2010, he graduated with an Executive MBA from the University of St. Gallen /Switzerland  (HSG). In 1999, Peter Bauer was hired as a Product Manager for Polarization Microscopy at Leica Microsystems in Wetzlar. Since 2005, he is based in Switzerland and has been heading the PM team of the Industry Division of Leica Microsystems since 2007. Within the Industry Division, he is responsible for Innovation and Commercialization of Products geared towards the markets in Education, Industry, Material Science and Forensic. Observing market trends, collecting the needs of the customers and transferring these into innovative products and solutions are the primary focus.

Area of a printed circuit board (PCB) which was imaged with extended depth of field (EDOF) using digital microscopy.

如何形成清晰的图像

在显微镜检查中,景深常被看做经验参数。在实际操作中,会根据数值孔径、分辨率和放大率之间的相关性确定该参数。为了获得最佳视觉效果,现代显微镜的调节设备在景深和分辨率之间实现了最佳平衡,这两个参数在理论上呈负相关。
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