Albert S. Laforet , M.S.

Albert S. Laforet

Albert Laforet is a scientific and Product Manager in the Innovation team for Metrology at Leica Microsystems. He has more than 7 years of experience in the field of Optical Metrology. He has presented multiple times different topics concerning metrology at international conferences and exhibitions worldwide. For his master’s thesis, he developed a new confocal tracking sensor for shape measurement of optical surfaces. He manages different products related to surface measurements which are sold worldwide. He also constantly works together with R&D to improve and optimize the products to satisfy todays challenging customer needs. He has expertise with various types of measurement microscopy technologies. In the past, he studied Electronic and Mechanical Engineering and has an international master’s degree in Photonics from the Polytechnic University of Catalonia in Barcelona, Spain.

表面计量学简介

本报告简要讨论了几种常用于评估表面形貌(也称为表面纹理或表面光洁度)的重要计量技术和标准定义。随着纳米技术、薄涂层以及电路和装置小型化的出现,表面计量学已成为一个极其重要的科学和工程领域。
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