Scott Walck , Dr.

Dr. Scott Walck is a Senior Scientist with SURVICE Engineering Company, providing science and engineering technology contract services to the Manufacturing and Materials Science Division of the US Army Research Laboratory (ARL) at Aberdeen Proving Ground. He is the electron microscopy subject matter expert for Scanning Electron Microscopy and Transmission Electron Microscopy within the Weapons and Materials Research Directorate. Scott has over 35 years of experience with microscopy and using ion beams for processing materials and preparing samples.

非聚焦离子束研磨的实践应用

机械抛光不仅费时费力，而且还会产生伪影，干扰扫描电子显微镜（SEM）的电子背散射衍射（EBSD）结果或光学显微镜研究。相比之下，离子束研磨可以消除干扰数据分析和图像解读的伪影。